Extension in Submicron CMOS Technology
نویسندگان
چکیده
In modern CMOS technologies reliability issues limit the maximum operating voltage of transistors. This prevents the integration of efficient power amplifiers (e.g., audio or RF) since stacked devices are needed to prevent breakdown, which reduces efficiency. Transistor reliability is strongly related to operating voltages; higher voltages result in faster degradation and hence in lower reliability and shorter life time. Degradation can be monitored by oxide degradation, threshold voltage-shifts and mobility reduction.
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